Acquisition Time is the time required for the output of the track/hold amplifiers to reach their final values, within ± 1/2 LSB, after the falling edge of INT (the point at which the track/ holds return to track mode). This includes switch delay time, slewing time and settling time for a full-scale voltage change.
DIP and SOIC
25 REF OUT
24 REF IN
Aperture Delay is defined as the time required by the internal switches to disconnect the hold capacitors from the inputs. This produces an effective delay in sample timing. It is measured by applying a step input and adjusting the CONVST input position until the output code follows the step input change.
22 DB0 (LSB) TOP VIEW (Not to Scale) 21 DB1
VDD DB11 (MSB)
APERTURE DELAY MATCHING
Aperture Delay Matching is the maximum deviation in aperture delays across the four on-chip track/hold amplifiers.
Aperture Jitter is the uncertainty in aperture delay caused by internal noise and variation of switching thresholds with signal level.
Droop Rate is the change in the held analog voltage resulting from leakage currents.
1 28 27 26
25 REF OUT
Channel-to-Channel Isolation is a measure of the level of crosstalk between channels. It is measured by applying a fullscale 1 kHz signal to the other three inputs. The figure given is the worst case across all four channels.
TOP VIEW (Not to Scale)
24 REF IN 23 AGND 22 DB0 (LSB) 21 DB1
DB11 (MSB) 10 DB10 11
SNR, THD, IMD
20 DB2 19 DB3
12 13 14 15 16 17 18
See DYNAMIC SPECIFICATIONS section.